The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 6785627 B1

PDF
Full Text
Expired
Date of Patent:
Aug. 31, 2004

Filed:

May. 22, 2003
Applicant:
Inventor:

William E. Corr, Twickenham, GB;

Assignee:

Micron Technology, Inc., Boise, ID (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 3/126 ;
U.S. Cl.
CPC ...
G01R 3/126 ;
Abstract

The invention relates to a combination for determining the effects of signal noise and cross-talk on on-chip propagation, comprising an integrated circuit, and a testing system having a signal generator, a plurality of ring oscillators responsive to the signal generator and a signal analyzer responsive to the plurality of ring oscillators for dynamically measuring the effects of noise and cross-talk on the integrated circuit. The plurality of ring oscillators includes a first ring oscillator constructed to mimic a data path within the integrated circuit, a second ring oscillator constructed with traces routed within the core logic area, a third ring oscillator randomly placed within the core logic area, and a fourth ring oscillator constructed to mimic a data path within the integrated circuit, the fourth ring oscillator sharing a power source with at least one component of the plurality of components within the core logic area.


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