The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 6785626 B1

PDF
Full Text
Expired
Date of Patent:
Aug. 31, 2004

Filed:

May. 22, 2003
Applicant:
Inventor:

William E. Corr, Twickenham, GB;

Assignee:

Micron Technology, Inc., Boise, ID (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 3/126 ;
U.S. Cl.
CPC ...
G01R 3/126 ;
Abstract

The invention relates to an integrated circuit, comprising a core logic area having a plurality of components therein, a first test circuit constructed to mimic a data path within the core logic area, a second test circuit constructed with a plurality of traces routed within the core logic area, a third test circuit constructed with a plurality of elements randomly placed within the core logic area, and a fourth test circuit constructed to mimic a data path within the core logic area, the fourth test circuit sharing a power source with at least one of the plurality of components within the core logic area. Each of the test circuits is operable to produce one or more signals for analyzing the effects of on-chip noise on signal propagation.


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