The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 31, 2004
Filed:
Sep. 29, 2000
Applicant:
Inventor:
Hsien-Cheng Emile Hsieh, Gold River, CA (US);
Assignee:
Intel Corporation, Santa Clara, CA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 1/540 ;
U.S. Cl.
CPC ...
G06T 1/540 ;
Abstract
A method and apparatus for efficient parametric surface binning based on control points. One method of the present invention comprises transforming control points for a parametric surface. An extent of the control points is determined. Tiles interested by the extent are determined. The parametric surface is stored into the tiles.