The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 31, 2004
Filed:
May. 07, 2003
Applicant:
Inventors:
Hiroki Nishida, Tokyo, JP;
Yoshihiro Nagura, Tokyo, JP;
Assignee:
Renesas Technology Corp., Chiyoda-Ku, JP;
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 3/102 ;
U.S. Cl.
CPC ...
G01R 3/102 ;
Abstract
When a test pattern is output that shows that a program has shifted to a subroutine, a subroutine stay time measuring circuit starts counting a count value that shows a program stay time in the subroutine, and outputs return instruction data when the count value reaches a predetermined value. A sequence control circuit controls a program counter value so that the program returns to a call originating routine when the sequence control circuit receives the return instruction data and also when a test pattern that shows that the program returns from the subroutine to the call originating routine is output.