The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 31, 2004

Filed:

Jul. 22, 2002
Applicant:
Inventor:

Masaaki Tanimura, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 3/126 ;
U.S. Cl.
CPC ...
G01R 3/126 ;
Abstract

In a testing board ( C), one end of each of a plurality of first wirings ( ) and one end of each of a plurality of second wirings ( ) are connected to a common point ( ). The other end of each of the second wirings ( ) is connected to a terminal ( ) of a semiconductor device ( ) under test. The second wirings ( ) have almost the same length. Signals outputted from drivers of a tester pin ( ) to the first wirings ( ) are composed at the common point ( ), and the composite wave is inputted to the terminal ( ) through each of the second wirings ( ). A relay ( ) is provided at a midpoint of each of the second wirings ( ) and is controlled such that the signals can be inputted to, for example, the terminal ( ) from the driver of the tester pin ( ) through one of third wirings ( ).


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