The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 17, 2004
Filed:
May. 24, 2001
Michael A. Marcus, Honeoye Falls, NY (US);
Kenneth J. Repich, Fairport, NY (US);
Eastman Kodak Company, Rochester, NY (US);
Abstract
Apparatus for measuring deflection of a film in a film gate having an aperture illuminated by a primary light source having an output spectrum, includes: a) a reflective photonic probe mounted in the film gate, the reflective probe having at least one optical fiber; b) a measurement light source coupled to reflective photonic probe and emitting a wavelength of light outside of the primary light source's spectrum; c) a photodetector coupled to the reflective photonic probe; d) a narrow pass optical filter located between the photodetector and the reflective photonic probe, the narrow pass filter passing the light from the measurement light source and blocking the light from the primary light source; and e) signal processing electronics connected to the photodetector for producing a signal representing the motion of the film perpendicular to the plane of the film.