The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 10, 2004

Filed:

Mar. 14, 2002
Applicant:
Inventors:

Frank Lambrecht, Mountain View, CA (US);

Ching-Chao Huang, San Jose, CA (US);

Michael Fox, Provo, UT (US);

Assignee:

Rambus Inc., Los Altos, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 1/750 ; G06F 1/900 ; G06F 1/300 ; H03D 1/00 ; H03K 5/26 ;
U.S. Cl.
CPC ...
G06F 1/750 ; G06F 1/900 ; G06F 1/300 ; H03D 1/00 ; H03K 5/26 ;
Abstract

A technique for determining performance characteristics of electronic systems is disclosed. In one exemplary embodiment, the technique may be realized as a method for determining performance characteristics of electronic systems. The method includes the steps of measuring a first response on a transmission medium from a falling edge transmitted on the transmission medium, and measuring a second response on the transmission medium from a rising edge transmitted on the transmission medium. The method also includes the step of determining worst case bit patterns for transmission on the transmission medium based upon the first response and the second response.


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