The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 03, 2004
Filed:
Aug. 05, 1998
Applicant:
Inventors:
Ralf Wolleschensky, Schoeten, DE;
Robert Grub, Heubach, DE;
Ulrich Simon, Jena, DE;
Martin Gluch, Jena, DE;
Andreas Faulstich, Aalen, DE;
Martin Voelcker, Koenigsbronn-Zang, DE;
Assignee:
Carl Zeiss Jena GmbH, Jena, DE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 2/106 ; G02B 2/100 ; G02B 2/758 ;
U.S. Cl.
CPC ...
G02B 2/106 ; G02B 2/100 ; G02B 2/758 ;
Abstract
The use of one or more wavefront modulators in the observation beam path and/or illumination beam path of a microscope provide various advantageous results. Such modulators may be adapted to change the phase and/or the amplitude of light in such a way to carry out displacement and shaping of the focus in the object space and correction of possible aberrations. The possible areas of use include confocal microscopy, laser-assisted microscopy, conventional light microscopy and analytic microscopy.