The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 27, 2004
Filed:
Feb. 05, 2001
Applicant:
Inventor:
Zongtao Ge, Omiya, JP;
Assignee:
Fuji Photo Optical Co., Ltd., Saitama, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 9/02 ;
U.S. Cl.
CPC ...
G01B 9/02 ;
Abstract
In a fringe analysis method comprising the step of subjecting fringe image data carrying wavefront information of an object to be observed to Fourier transform method so as to determine a wavefront of the object, the fringe image data is multiplied by a window function corresponding to an effective data area of the fringe image data before the Fourier transform method is applied to.