The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 13, 2004
Filed:
Oct. 02, 2002
Applicant:
Inventor:
Kwok Tam, Edison, NJ (US);
Assignee:
Siemens Corporate Research, Inc., Princeton, NJ (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G21K 1/12 ;
U.S. Cl.
CPC ...
G21K 1/12 ;
Abstract
Improved image reconstruction methods for cone beam ROI (region of interest) imaging of long objects with an area detector using a two or more circular scans and a connecting line scan, wherein essentially the entire detector area is utilized for acquiring cone beam data for all source positions.
Tam, Kwok. (2004). Cone beam computed tomography imaging system and method providing efficient utilization of detector area (U.S. Patent No. 6763081). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6763081
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile