The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 13, 2004
Filed:
Nov. 25, 2002
Applicant:
Inventors:
Huade Walter Yao, Livermore, CA (US);
Kurt Owen Taylor, San Jose, CA (US);
Assignee:
Advanced Micro Devices, Inc., Sunnyvale, CA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 3/102 ;
U.S. Cl.
CPC ...
G01R 3/102 ;
Abstract
A testing system and method of operation therefor is provided including a test fixture for electrical testing above a thermal threshold temperature of a low dielectric constant material and having a test-chip-die-sized enclosed volume. The test fixture has an electrical connection from the enclosed volume to the outside thereof and a removable lid for sealing the enclosed volume in the test fixture.
Yao, Huade. (2004). Testing system and method of operation therefor including a test fixture for electrical testing of semiconductor chips above a thermal threshold temperature of an interlayer dielectric material (U.S. Patent No. 6762613). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6762613
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile