The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 06, 2004
Filed:
Sep. 27, 2001
Applicant:
Inventor:
Takeshi Tomita, Tokyo, JP;
Assignee:
Jeol Ltd., Tokyo, JP;
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G03H 5/00 ;
U.S. Cl.
CPC ...
G03H 5/00 ;
Abstract
An electron microscope equipped with an electron biprism is provided with second and third objective lenses placed between a sample and the electron biprism such that the sample is not affected by the magnetic fields produced by the objective lenses. The magnification of a TEM image of the sample at the focal point H is controllably varied by appropriately controlling the excitations of the objective lenses. The spacing of carrier fringes is adjusted by controllably varying the voltage applied to a line electrode of the biprism.