The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 22, 2004

Filed:

Dec. 11, 2001
Applicant:
Inventors:

Hirotsugu Hashimoto, Saitama, JP;

Norio Taniguchi, Saitama, JP;

Motoshi Tanaka, Saitama, JP;

Yoshihide Nishiyama, Saitama, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 3/700 ;
U.S. Cl.
CPC ...
G01N 3/700 ;
Abstract

An extremely convenient apparatus for evaluating the inner quality of vegetables and fruits which is small and inexpensive, can be introduced easily even by small-scaled enterprisers, in which an installation place can be changed easily, and safety and promptness of the replacing work of light sources are fully taking into consideration is provided. An apparatus for evaluating the inner quality of vegetables and fruits comprising: a place bed on which vegetables and fruits A are placed; light sources disposed to irradiate vegetables and fruits A; a spectra/detection unit for making spectra in transmission light C having transmitted through vegetables and fruits A to detect the optical strength; an operation processing section for calculating and evaluating the quality evaluation amount of the sugar degree and the ripening degree on the basis of the detection signal; and a display panel for displaying the quality evaluation amount of the sugar degree and the ripening degree, the apparatus capable of being installed on the table, and also being portable. Further, a light source peripheral temperature T and an environmental temperature T are detected in a manner of a lapse of time, the light source peripheral temperature T is compared with a safety setting temperature T or the environmental temperature T , and the fact that the light source temperature is fully lowered is reported.


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