The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 15, 2004
Filed:
Oct. 30, 2002
Kazunori Tsutsui, Hirakata, JP;
Tsutomu Mizuguchi, Shiga, JP;
Otsuka Electronics Co., Ltd., Hirakata, JP;
Abstract
The constitution of a probe for measuring light scattering according to this invention is as follows: a light input optical fiber and a scattered light measuring optical fiber for collecting and transmitting scattered light are inserted into a main body of the probe ; the optical fiber is passed through a hole provided in the probe for measuring light scattering to extend outward; an end portion of each of the optical fibers is covered with a ferrule or ; an end of each of the ferrules is cut into the shape of a truncated cone such that a part of or the entire end face of the optical fiber or remains; and the ferrules are held by a support body and the like in such a manner that the end faces of the optical fibers are disposed to be adjacent to each other at a predetermined angle with a predetermined distance in between. Accordingly, the end portions of the optical fibers can be reinforced and protected by the ferrules even when they have poor strength. In addition, cutting the ends of the ferrules into the shape of a truncated cone allows the distance between the end faces of the optical fibers to be reduced.