The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 08, 2004
Filed:
Dec. 30, 1999
Applicant:
Inventors:
Joel T. Yuen, Mesa, AZ (US);
Kailasnath S. Maneparambil, Chandler, AZ (US);
Puneet Singh, San Jose, CA (US);
Assignee:
Intel Corporation, Santa Clara, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 1/750 ;
U.S. Cl.
CPC ...
G06F 1/750 ;
Abstract
A scan cell design approach includes removing a formal verification property associated with a scan cell from a set of formal verification properties to create a reduced set of formal verification properties. A formal verification assumption verification process is then performed on a schematic using assumptions generated from the reduced set of formal verification properties. An output of the assumption verification process indicates whether there is a potential contention site at logic coupled to the output of the scan cell.