The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 25, 2004
Filed:
May. 07, 2001
Applicant:
Inventor:
Tokuya Osawa, Tokyo, JP;
Assignee:
Renesas Technology Corp., Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 3/13177 ;
U.S. Cl.
CPC ...
G01R 3/13177 ;
Abstract
An apparatus for testing a semiconductor integrated circuit using an actual operating frequency of the semiconductor integrated circuit includes a test target circuit which is to be tested and has a scan path in the test target circuit for executing a test. The apparatus also includes a test pattern generation circuit which generates, after completion of the test, a signal for scanning out a test result synchronously with an edge of a test clock signal with a lower frequency than the actual operating frequency, and outputs a scan-out control signal to the scan path.