The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 25, 2004

Filed:

Dec. 27, 2001
Applicant:
Inventors:

Masafumi Asano, Yokohama, JP;

Tadahito Fujisawa, Tokyo, JP;

Kyoko Izuha, Yokohama, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G03B 2/732 ;
U.S. Cl.
CPC ...
G03B 2/732 ;
Abstract

An exposure method is disclosed, which comprises exposing a light on a photomask having a mask pattern, in an exposing device, receiving in the exposing device the light which passed through the photomask to observe an optical image of the mask pattern based on the received light, deciding an optimum exposure condition based on the optical image of the mask pattern to form a predetermined resist pattern, and exposing a light on a photoresist film formed on a wafer via the photomask based on the optimum exposure condition.


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