The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 25, 2004
Filed:
Sep. 17, 1999
Applicant:
Inventors:
Hau H. Duong, Los Angeles, CA (US);
Stephen D. O'Connor, Pasadena, CA (US);
Robert H. Terbrueggen, Manhattan Beach, CA (US);
Jon Faiz Kayyem, Pasadena, CA (US);
Gary T. Olsen, La Crescenta, CA (US);
Daniel A. Litvack, Sherman Oaks, CA (US);
Javier Gonzalez, Pasadena, CA (US);
Assignee:
Clinical Micro Sensors, Inc., Pasadena, CA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
C12M 1/34 ; C12Q 1/68 ; G01N 3/353 ; C12P 1/934 ;
U.S. Cl.
CPC ...
C12M 1/34 ; C12Q 1/68 ; G01N 3/353 ; C12P 1/934 ;
Abstract
The invention relates to the use of signal processing methods in order to acheive higher signal to noise ratios, to increase the detection limits of target analytes. These techniques include the monitoring of the output signal at higher harmonic frequencies.
Published as:
Quick Actions:
Duong, Hau. (2004). Signal detection techniques for the detection of analytes (U.S. Patent No. 6740518). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6740518
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile