The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 18, 2004
Filed:
Feb. 16, 2001
Wilfried M. Osberger, Portland, OR (US);
Tektronix, Inc., Beaverton, OR (US);
Abstract
A robust technique for estimating camera motion parameters calculates the motion vectors for a current frame vis a vis a previous frame using a multi-scale block matching technique. The means of the motion vectors for the current and the previous frames are compared for a temporal discontinuity, the detection of such temporal discontinuity as a temporal repetition, such as frozen field or 3:2 pulldown, terminating the processing of the current frame with the camera motion parameter estimate for the previous frame being used for the current frame. Otherwise motion vectors for spatially flat areas and text/graphic overlay areas are discarded and an error-of-fit for the previous frame is tested to determine initial parameters for an iterative camera motion estimation process. If the error-of-fit is less than a predetermined threshold, then the camera motion parameters for the previous frame are used as the initial parameters, otherwise a best least squares fit is used as the initial parameters. Outlier motion vectors are removed and the camera motion parameters are recalculated using a least squares best fit in an iterative process until either the error-of-fit for the current frame is less than the predetermined threshold or the number of iterations exceeds a maximum. The estimated camera motion parameters and associated error-of-fit are provided as an output.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile