The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 18, 2004

Filed:

Nov. 14, 2001
Applicant:
Inventors:

Alexis Kudryashov, Moscow, 117333, RU;

Andrey Viktorocvich Larichev, Moscow, 121433, RU;

L. John Otten, Placitas, NM (US);

Assignee:

Other;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 3/14 ;
U.S. Cl.
CPC ...
A61B 3/14 ;
Abstract

An ophthalmic instrument (for obtaining high resolution, wide field of area multi-spectral retinal images) including a fundus retinal imager, (which includes optics for illuminating and imaging the retina of the eye); apparatus for generating a reference beam coupled to the fundus optics to form a reference area on the retina; a wavefront sensor optically coupled to the fundus optics for measuring the wavefront produced by optical aberrations within the eye and the imager optics; wavefront compensation optics coupled to the fundus optics for correcting large, low order aberrations in the wavefront; a high resolution detector optically coupled to the imager optics and the wavefront compensation optics; and a computer (which is connected to the wavefront sensor, the wavefront compensation optics, and the high resolution camera) including an algorithm for correcting, small, high order aberrations on the wavefront and residual low order aberrations.


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