The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 27, 2004
Filed:
Aug. 18, 1999
Yoshihito Kobayashi, Tokyo, JP;
Advantest Corporation, Tokyo, JP;
Abstract
A method of judging whether an electronic component is good or defective in accordance with a response output signal by inputting a test signal to the IC to be tested, wherein a common test signal is input to respective electronic devices A and A of a group of electronic devices composed of a plurality of electronic devices, and in accordance with a response signal thereof, the group of electronic devices as a whole subjected to the test is judged to be good or defective. In the second test, each of the DUTs A and A of the group of electronic devices judged to be defective is input a mutually independent test signal, and in accordance with the response signal thereof, it is judged whether each of the electronic devices A and A subjected to the test is good or defective.