The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 20, 2004

Filed:

Aug. 14, 2000
Applicant:
Inventors:

Guo-Qing Wei, Plainsboro, NJ (US);

Jianzhong Qian, Princeton Jct., NJ (US);

Helmuth Schramm, Neunkirchen, DE;

Assignee:

Siemens Corporate Research, Inc., Princeton, NJ (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 ;
U.S. Cl.
CPC ...
G06K 9/00 ;
Abstract

A system and method for detecting pedicle positions in an image, in accordance with the present invention, includes providing a set of feature prototypes for a plurality of pedicle positions and orientations, providing an input image to be analyzed for pedicle positions and orientations, and determining intensity curvatures for a pedicle in the input image. The intensity curvatures are transformed to determine a feature vector for the pedicle in the input image. The feature vector is correlated to the feature prototypes to determine most likely positions and orientations of the pedicle.


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