The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 20, 2004
Filed:
Aug. 21, 2002
Hideyuki Nasu, Tokyo, JP;
Takehiko Nomura, Toyko, JP;
Tomohiro Takagi, Tokyo, JP;
Mizuki Oike, Tokyo, JP;
The Furukawa Electric Co., Ltd., Tokyo, JP;
Abstract
A wavelength monitor capable of obtaining an optical detection signal of high quality is proposed. In the wavelength monitor, a light incident surface of an optical filter is disposed with an inclination relative to the light incident direction. With this arrangement, it is possible to make the route of a reflection light that has been reflected from the light incident surface of the optical filter deviate large from the route of an incident light that has been incident to the optical filter. Consequently, the reflected light is prevented from being incident to a semiconductor laser device or optical detectors.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile