The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 20, 2004

Filed:

Nov. 13, 2002
Applicant:
Inventors:

Ming-Sheng Yang, Hsin-Chu, TW;

Chia-Hung Kao, Tai-Nan, TW;

Chin-Cheng Chien, Chia-Yi Hsien, TW;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 2/1336 ; H01L 2/13205 ; H01L 2/144 ;
U.S. Cl.
CPC ...
H01L 2/1336 ; H01L 2/13205 ; H01L 2/144 ;
Abstract

A gate oxide layer and a gate are sequentially formed on a substrate, and a source/drain extension is formed in the substrate thereafter. A liner layer is then formed to cover the substrate, and a first dielectric layer and a second dielectric layer are sequentially formed on the liner layer. By performing an etching process, a L-shaped spacer is formed on either side of the gate. Portions of the liner layer uncovered by the L-shaped spacer are then removed, and a step source/drain extension and a source/drain are simultaneously formed in the substrate thereafter. Finally, a salicide process is performed to form a silicide layer on the gate and on portions of the silicon substrate surface above the source/drain.


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