The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 13, 2004
Filed:
Feb. 25, 2002
Applicant:
Inventors:
Duck-Young Kim, Kwangju, KR;
Young Choon Yook, Jeonju, KR;
Yong Woo Park, Seoul, KR;
Nak Hyoun Sung, Kongju, KR;
Assignee:
Kwangju Institute of Science and Technology, Kwangju, KR;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 1/106 ;
U.S. Cl.
CPC ...
G01B 1/106 ;
Abstract
The present invention provides an apparatus for measuring the thickness of a material using the focal length of a lensed fiber and an associated method. The lensed fiber generates a Gaussian Beam and moves vertically with respect to the material. The strength of the beam reflected from the material is detected when the beam emitted from the lensed fiber is focused on the material. The thickness of the material is calculated based upon the detected strength of the reflected beam.