The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 06, 2004
Filed:
Jun. 06, 2002
Applicant:
Inventor:
Stephen K. Sunter, Nepean, CA;
Assignee:
LogicVision, Inc., San Jose, CA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 3/108 ; G01R 3/128 ;
U.S. Cl.
CPC ...
G01R 3/108 ; G01R 3/128 ;
Abstract
A method for testing an integrated circuit (IC) for open defects in a printed wire connected to an IC pin of the IC, the method includes measuring the capacitance of the IC pin; comparing the value of the measured capacitance to an expected IC pin capacitance value for the pin unconnected, and determining that an open defect exists proximate the pin when the measured capacitance is less than a predetermined value based on the expected IC pin capacitance value.