The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 06, 2004
Filed:
Jul. 09, 2002
Applicant:
Inventor:
Tatsunori Komoike, Tokyo, JP;
Assignee:
Renesas Technology Corp., Tokyo, JP;
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 2/900 ;
U.S. Cl.
CPC ...
H01L 2/900 ;
Abstract
The invention provides a semiconductor integrated circuit device that includes a combination circuit incorporated in a chip, plural input pads and output pads, and a shift register made up with plural SFFs in which the input pins and output pins of the consecutive SFFs are connected, respectively, to the input pads and the output pads directly or via the combination circuit. In this configuration, the output pads and the input pads are connected to each other inside the chip to thereby form a test path.
Komoike, Tatsunori. (2004). Semiconductor integrated circuit device having a test path (U.S. Patent No. 6717235). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6717235
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile