The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 30, 2004

Filed:

Mar. 04, 2002
Applicant:
Inventors:

Victor A. Chang, Palo Alto, CA (US);

William Lam, Newark, CA (US);

Assignee:

Sun Microsystems, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 1/750 ;
U.S. Cl.
CPC ...
G06F 1/750 ;
Abstract

One embodiment of the present invention provides a system that facilitates generating a simulation module for testing a system design. The system operates by receiving a system specification, which specifies correct behavior for modules within the system design. The system also receives modules that are individually designed to this system specification. The system then compares the modules with the system specification to identify nonfunctioning modules that can include either missing modules or incorrect modules. The system also determines an interface for the nonfunctioning modules from the system specification, which specifies input and output requirements for these nonfunctioning modules. The system then generates the simulation module. This simulation module can function in place of the nonfunctioning module and can simulate a functionality assigned to the nonfunctioning module.


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