The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 23, 2004
Filed:
Oct. 18, 1999
Applicant:
Inventors:
Xiaohua Huang, Mountain View, CA (US);
Thomas B Ryder, Los Gatos, CA (US);
Paul Kaplan, Campbell, CA (US);
Assignee:
Affymetrix, Inc., Santa Clara, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C12Q 1/68 ; C07H 2/104 ; C12M 1/36 ;
U.S. Cl.
CPC ...
C12Q 1/68 ; C07H 2/104 ; C12M 1/36 ;
Abstract
A method for determining the genotype of one or more individuals at a polymorphic locus employs amplification of a region of DNA using primers containing tags and hybridization of the products to one or more probes on a solid support. The genotype or ratio of alleles is identified from the pattern of hybridization. The method can also be used to determine the frequency of different alleles in a population.