The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 6709632 B1

PDF
Full Text
Expired
Date of Patent:
Mar. 23, 2004

Filed:

May. 18, 2001
Applicant:
Inventors:

Yoshitomi Nakagawa, Chiba, JP;

Yasuyuki Takagi, Chiba, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 2/700 ;
U.S. Cl.
CPC ...
G01N 2/700 ;
Abstract

An ICP analyzer has a nebulizer for nebulizing a sample fluid for the purpose of analyzing microscopic impurities within the sample fluid, a plasma torch for introducing nebulized spray into a plasma, and a spray chamber disposed between the nebulizer and the plasma torch for separating spray comprised of microscopic particles from the nebulized spray prior to introduction thereof into the plasma torch. A heating section is provided at a central portion of the spray chamber and a cooling section is provided at a peripheral section of the spray chamber, and the spray is passed between the heating section and the cooling section to improve the efficiency sample introduction into the plasma to enable highly sensitive analysis by suppressing the proportion of a solvent component that reaches the plasma torch.


Find Patent Forward Citations

Nakagawa, Yoshitomi. (2004). Icp analyzer (U.S. Patent No. 6709632). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6709632

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