The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 16, 2004
Filed:
Oct. 18, 2000
L. Owen Farnsworth, Lincoln, VT (US);
Brion L. Keller, Conklin, NY (US);
Bernd K. Koenemann, San Jose, CA (US);
Timothy J. Koprowski, Newburgh, NY (US);
Thomas J. Snethen, Endwell, NY (US);
Donald L. Wheater, Hinesburg, VT (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
Deterministic random Logic Built In Self Test (LBIST) is disclosed that applies Deterministic Stored Pattern Tests (DSPTs) by using random LBIST. Basically, the present invention selects the appropriate pseudorandom pattern for use with a scan cycle that needs care bits. The scan cycle may be a current or future scan cycle. In particular, the present invention determines care bits for a particular scan cycle. A pseudorandom pattern is generated that is then aligned with the particular scan cycle. If the pseudorandom pattern contains the care bits, with the correct values and in the proper positions within the pattern, this alignment tests one or more logic devices.