The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 02, 2004
Filed:
Oct. 04, 2002
Takashi Noda, Kawasaki, JP;
Kozo Sugita, Kawasaki, JP;
Mitutoyo Corporation, Kawasaki, JP;
Abstract
A calibration reference work sphere is measured to obtain measured values by using a probe vector given before updating is made by exchanging the probe for a new one or by changing the posture of the probe. Then, the measured values are error-corrected by using the probe vector given before updating to thereby obtain the coordinates of the center of the reference sphere. The difference between the obtained coordinates and the coordinates of the center of the reference sphere before updating of the probe is obtained to thereby calculate a predicted probe vector. A calibration measurement part program for measuring the calibration reference sphere by using the predicted probe vector is generated and executed for performing calibration measurement. A calibration value of the probe vector is calculated on the basis of the result of the calibration measurement.