The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 02, 2004
Filed:
Mar. 05, 2002
Thomas C. Hill, Beaverton, OR (US);
Xiaofen Chen, West Linn, OR (US);
Soraya J. Matos, Beaverton, OR (US);
Leroy J. Willmann, Portland, OR (US);
Kyle L. Bernard, Tigard, OR (US);
Linley F. Gumm, Beaverton, OR (US);
Tektronix, Inc., Beaverton, OR (US);
Abstract
An improved calibration method for a vector network analyzer stores sparse calibration data, interpolates system error data from the sparse calibration data for each measurement by the vector network analyzer, and creates calibrated measurement data from the system error data and uncorrected measurement data at each measurement frequency. The sparse calibration data may be generated by measuring every Nth frequency step over a calibration frequency range greater than a specified measurement frequency range, or by measuring every frequency step over the calibration frequency range and compressing the resulting measurement data. The interpolation may be achieved by using a curve-fit algorithm, such as a parametric polynomial curve fitting algorithm.