The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 24, 2004
Filed:
Dec. 21, 2001
Yukio Tsuda, Kanagawa-ken, JP;
Anritsu Corporation, Tokyo, JP;
Abstract
A two-beam interferometer splits an incident light in two optical paths, combines and outputs split lights together again. The two-beam interferometer generates at least one or more combined light made from two beams each having a polarization different from each other. A polarization state detector detects a variation in the polarization of the combined light generated by the two-beam interferometer. An electric circuit calculates an wavelength of the incident light based on the variation in the polarization detected by the polarization state detector. The two optical paths of the two-beam interferometer has a difference in length between a point of splitting the incident light and a point of combining the split lights, for the detection of polarization variation in the combined light by the polarization state detector. The optical path length difference between the two paths is fixed.