The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 17, 2004
Filed:
Dec. 11, 2000
Applicant:
Inventor:
Zongtao Ge, Omiya, JP;
Assignee:
Fuji Photo Optical Co., Ltd., Saitama, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 9/02 ;
U.S. Cl.
CPC ...
G01B 9/02 ;
Abstract
When analyzing the fringe pattern of an object to be observed by using Fourier transform method with respect to closed interference fringe image data, the original data expressed by an orthogonal coordinate system are once converted into fringe image data represented by a polar coordinate system, the converted data are analyzed by the conventional Fourier transform method, and then the resulted data are converted back into the original orthogonal coordinate system by inverse coordinate transformation, so as to obtain the wavefront corresponding to the original wavefront to be observed.