The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 10, 2004
Filed:
Feb. 08, 2000
Bozidar Janko, Portland, OR (US);
Shane Ching-Feng Hu, Beaverton, OR (US);
Tektronix, Inc., Beaverton, OR (US);
Abstract
A technique for image alignment with global translation and linear stretch determines translation parameters for three corresponding linearly displaced blocks in a reference image and a corresponding distorted test image. From the differences between the translation parameters for the three blocks the presence of stretch is detected and, if detected, a stretch factor is estimated. The estimated stretch factor is used as a starting point to stretch the reference image to overlap the distorted test image as a refinement process. The resulting refined stretch factor is then used in a reverse stretch process to shrink the distorted test image, and the distorted test image is then aligned with the reference image to obtain picture quality metrics.