The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 10, 2004

Filed:

Sep. 10, 2001
Applicant:
Inventors:

Samir Chaudhry, Orlando, FL (US);

Paul Arthur Layman, Orlando, FL (US);

John Russell McMacken, Orlando, FL (US);

Ross Thomson, Clermont, FL (US);

Jack Qingsheng Zhao, Orlando, FL (US);

Assignee:

Agere Systems Inc., Allentown, PA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 2/932 ; H01L 2/974 ; H01L 3/1111 ; H01L 2/9423 ; H01L 3/10328 ; H01L 3/10336 ; H01L 3/1072 ; H01L 3/1109 ; H01L 2/973 ; H01L 2/980 ; H01L 3/1112 ; H01L 2/976 ; H01L 2/994 ; H01L 3/1062 ; H01L 3/1113 ; H01L 3/1119 ;
U.S. Cl.
CPC ...
H01L 2/932 ; H01L 2/974 ; H01L 3/1111 ; H01L 2/9423 ; H01L 3/10328 ; H01L 3/10336 ; H01L 3/1072 ; H01L 3/1109 ; H01L 2/973 ; H01L 2/980 ; H01L 3/1112 ; H01L 2/976 ; H01L 2/994 ; H01L 3/1062 ; H01L 3/1113 ; H01L 3/1119 ;
Abstract

A vertical JFET architecture. Generally, an integrated circuit structure includes a semiconductor area with a major surface formed along a plane and a first source/drain doped region formed in the surface. A second doped region forming a channel of different conductivity type than the first region is disposed over the first region. A third doped region is formed over the second doped region having an opposite conductivity type with respect to the second doped region, and forming a source/drain region. A gate is formed over the channel to form a vertical JFET.


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