The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 03, 2004
Filed:
Sep. 28, 2000
Applicant:
Inventor:
Binglong Zhang, Austin, TX (US);
Assignee:
Intel Corporation, Santa Clara, CA (US);
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 1/04 ;
U.S. Cl.
CPC ...
G06F 1/04 ;
Abstract
A device and method to detect and correct clock duty cycle skew detected in high performance microprocessor having a very high frequency clock. The device relies on a delay chain circuit to delay the clock signal and determine the presence of clock duty cycle skew. The device uses simple latches, flops and phase-detectors to compare and identify the nature of the clock duty cycle skew. Simple logic is then employed to measure and determine the amount and direction of de-skew to apply to the clock signal. After the de-skew operation, the clock duty cycle cycles used to control the execution of the microprocessor are of uniform time duration.