The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 03, 2004

Filed:

Mar. 09, 2001
Applicant:
Inventors:

Francesco Brianti, San Jose, CA (US);

Bertrand Gabillard, Paris, FR;

Martin Aureliano Hassner, Palo Alto, CA (US);

Manfred Ernst Schabes, San Jose, CA (US);

Yoshiaki Sonobe, San Jose, CA (US);

Barry Marshall Trager, Yorktown Heights, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11B 5/09 ;
U.S. Cl.
CPC ...
G11B 5/09 ;
Abstract

A Hilbert transform is used to process perpendicular magnetic recording signals from both single layer and dual layer disks to produce a complex analytic signal. This complex analytic signal is used to derive angles of magnetization, which depend on the distance between recorded magnetic transitions and consequently which can be used in error estimation. Moreover, the Hilbert transform in cooperation with an equalizer FIR optimizes transformation of the signal such that conventional longitudinal recording processing methods can subsequently be used to process the signal that is read back from the magnetic recording medium.


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