The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 27, 2004

Filed:

May. 15, 2001
Applicant:
Inventors:

David Kil, Gilroy, CA (US);

Ken Fertig, Palo Alto, CA (US);

Assignee:

Rockwell Technologies, LLC, Thousand Oaks, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 1/730 ; G06F 7/00 ;
U.S. Cl.
CPC ...
G06F 1/730 ; G06F 7/00 ;
Abstract

A system and method for estimating the point of diminishing returns for additional information in data mining processing applications. The present invention provides a convenient method of estimating the extent to which a data mining algorithm captures useful information in raw feature data. First, the input data is processed using a forward transform. A region of overlap Y in the forward transformed data is identified and quantified. The region of overlap Y is processed with a reverse transform to create an overlap region Z in an original feature space. The degree of overlap in region Z is quantified and compared to a level of overlap in the Y region, such that the comparison quantifies the extent to which a data mining algorithm captures useful information in the input data.


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