The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 6683452 B1

PDF
Full Text
Expired
Date of Patent:
Jan. 27, 2004

Filed:

Nov. 30, 2001
Applicant:
Inventors:

Jin-yi Lee, Gimhae, KR;

Won-ha Choi, Gimhae, KR;

Min-soo Kim, Busan, KR;

Dae-jung Kim, Busan, KR;

Moon-phil Kang, Busan, KR;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 2/772 ;
U.S. Cl.
CPC ...
G01N 2/772 ;
Abstract

A display apparatus of magnetic flux density for detecting an internal crack of a metal or a shape of the metal includes a three-dimensional magnetic flux focusing unit installed near the metal, for concentrating magnetic flux generated by the metal, a magnetic flux density measurement unit installed near the magnetic flux focusing unit, for measuring changes in magnetic flux density concentrated by the magnetic flux focusing unit, and a display unit electrically connected with the magnetic flux measurement unit, for real-time displaying and storing changes in the magnetic flux density.


Find Patent Forward Citations

Lee, Jin-yi. (2004). Magnetic flux density apparatus for, e.g., detecting an internal crack of a metal or a shape of the metal (U.S. Patent No. 6683452). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6683452

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