The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 13, 2004
Filed:
Jul. 19, 2001
Tohru Koyama, Tokyo, JP;
Renesas Technology Corp., Tokyo, JP;
Abstract
A failure analysis device is provided which can realize automatic light emission analysis even when the tested chips have logic LSIs etc. fabricated therein. A comparator ( ) compares individual Iddq values (I ) to (In) sequentially provided from a probe card ( ) with a threshold (Ith ) provided from a main control unit ( ). An abnormality occurrence vector specifying unit ( ) receives data (D ) about the results of comparison from the comparator ( ) and specifies an abnormality occurrence vector or vectors from among a plurality of test vectors (TB ) to (TBn) on the basis of the data (D ). More specifically, the abnormality occurrence vector specifying unit ( ) specifies the test vector as the abnormality occurrence vector when the corresponding detected Iddq value is larger than the threshold (Ith ).