The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 13, 2004
Filed:
Jun. 26, 2001
Patrick H. Buffet, Essex Junction, VT (US);
Douglas C. Heaberlin, Underhill, VT (US);
Leah M. P. Pastel, Essex Junction, VT (US);
Yu H. Sun, Williston, VT (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A method for improving the signal-to-noise ratio in an I defect test is disclosed. An integrated circuit is divided into a plurality of areas and each area is provided with and bounded by terminals. An I defect is activated to generate I defect current within the integrated circuit. An amount of I defect current generated within each area is measured at the terminals provided thereto. Based on the I current measurement on each area, an I current map is created. By analyzing the I current map, the presence and location of the defect is determined. Based on the determination, the I defect is isolated.