The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 13, 2004
Filed:
Aug. 21, 2002
Applicant:
Inventor:
James A. Faull, Nampa, ID (US);
Assignee:
Micron Technology, Inc., Boise, ID (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 3/102 ;
U.S. Cl.
CPC ...
G01R 3/102 ;
Abstract
The spring-loaded contact probe electrically connects a semiconductor device, such as a device under test (DUT) with a substrate, such as a DUT board to be coupled with testing equipment. The probe comprises a barrel, two probes slidable within the barrel, and two isolated springs for loading the probes. The two isolated springs allow the probes to be engaged without affecting the connection of the opposite probe. The barrel housing the probes is securely attached within a socket. An array of these sockets may be used as a connector device between the DUT and DUT board.