The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 13, 2004

Filed:

Aug. 28, 2001
Applicant:
Inventors:

Akihito Otani, Atsugi, JP;

Toshinobu Otsubo, Atsugi, JP;

Hiroto Watanabe, Atsugi, JP;

Assignee:

Anritsu Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 1/04 ; G01J 1/42 ; G01J 5/08 ;
U.S. Cl.
CPC ...
G01J 1/04 ; G01J 1/42 ; G01J 5/08 ;
Abstract

A common reference signal is applied from the same reference signal generating portion to a reference signal input terminal of a signal under test generator and a reference signal input terminal of a sampling signal generator circuit. A sampling frequency is set to the sampling signal generator circuit such that a desired delay time can be obtained relevant to a phase of a signal under test. In the sampling signal generator circuit, the sampling signal having a cycle that corresponds to the sampling frequency is generated based on the common reference signal and the sampling frequency. A repetition cycle of the signal under test and a repetition cycle of the sampling signal are set based on a cycle of the common reference signal so that the repetition cycle of the sampling signal can be set independently of the repetition cycle of the signal under test.


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