The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 06, 2004
Filed:
Jan. 10, 2002
Karsten Urban, Jena, DE;
Leica Microsystems Jena GmbH, Jena, DE;
Abstract
An arrangement for the visual inspection of substrates (S) comprises a microscope ( ) for viewing the substrate (S) present at an inspection point (I); at least one viewing field ( ), arranged next to a microscope viewing port ( ), for viewing an image or an image area of the substrate (S); and/or at least one further viewing field ( ), arranged next to the microscope viewing port ( ), for direct viewing of the substrate (S) or a portion of the substrate (S); the microscope viewing port ( ) and the viewing fields ( ) being arranged with respect to an operating position (P) in such a way that from the operating position (P), the viewer looks in a first viewing direction (A) perpendicularly onto the microscope viewing port ( ), and in at least one further viewing direction (B, B′) approximately perpendicularly in each case onto one of the viewing fields ( ). The first viewing direction (A) and the viewing directions (B, B′) enclose acute angles (&agr;, &agr;′). The result is to create an inspection arrangement notable for favorable ergonomic properties and a compact design.