The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 06, 2004

Filed:

Jan. 07, 2000
Applicant:
Inventors:

Val Cook, Shingle Springs, CA (US);

Kam Leung, El Dorado Hills, CA (US);

Wing Hang Wong, Folsom, CA (US);

Assignee:

Intel Corporation, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 7/01 ; H04N 9/64 ; H04N 9/67 ; H04N 1/120 ;
U.S. Cl.
CPC ...
H04N 7/01 ; H04N 9/64 ; H04N 9/67 ; H04N 1/120 ;
Abstract

A method and circuit are provided for color space conversion of Y (luminance) and UV (chrominance) components from a planar YUV 4:2:0 format to an interleaved, or packed YUV 4:2:2 format, and from an interleaved, or packed YUV 4:2:2 format to a planar YUV 4:2:0 format. The method for both conversions includes reading source data, interpolating the sampled YUV component values, and performing a pass to thereby write the converted YUV component values in three passes, one pass for all values of the respective YUV components.


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