The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 30, 2003
Filed:
Dec. 13, 2000
Cigdem Y. Milobinski, Scappoose, OR (US);
David L. Kreitzer, Hillsboro, OR (US);
Max W. Gravitt, Morrisville, NC (US);
Intel Corporation, Santa Clara, CA (US);
Abstract
An automated method for determining problematic binary files. A group of source code files is compiled using two different compiling environments. One of the compiling environments yields a failing set of binary files (i.e., the resultant executable program exhibits problematic behavior). The other compiling environment yields a passing set of binary files (i.e., the resultant executable program does not exhibit problematic behavior). Complementary sets of files, containing some passing files and some failing files, are used to create test executable programs. The test executable programs are evaluated against pass/fail criteria. The results of these evaluations are used to isolate the problematic binary file or set of files. The process is continued iteratively until the problematic file is determined. According to one embodiment the two compiling environments may be different modes of a given compiler. In one embodiment an algorithm is used to select the passing files and failing files used to create the test executable program. The algorithm is capable of determining two or more files, the interaction of which, causes the test executable program to fail.