The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 30, 2003

Filed:

Apr. 23, 2001
Applicant:
Inventors:

John D. Larson, III, Palo Alto, CA (US);

Herbert L. Ko, Mountain View, CA (US);

Richard K. Karlquist, Cupertino, CA (US);

Mark A. Hueschen, Palo Alto, CA (US);

Kent W. Carey, Palo Alto, CA (US);

Assignee:

Agilent Technologies, Inc., Palo Alto, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 2/902 ; G01N 2/100 ; G01N 3/300 ; C23C 1/452 ;
U.S. Cl.
CPC ...
G01N 2/902 ; G01N 2/100 ; G01N 3/300 ; C23C 1/452 ;
Abstract

Systems and methods of monitoring thin film deposition are described. In one aspect, a thin film deposition sensor includes an acoustical resonator (e.g., a thin film bulk acoustical resonator) that has an exposed surface and is responsive to thin film material deposits on the exposed surface. A substrate clip may be configured to attach the thin film deposition sensor to a substrate. A transceiver circuit may be configured to enable the thin film deposition sensor to be interrogated wirelessly. A method of monitoring a thin film deposition on a substrate also is described.


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