The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 23, 2003

Filed:

Jan. 09, 2002
Applicant:
Inventors:

Lisa McIlwain, Portland, OR (US);

Demosthenes Anastasakis, Tigard, OR (US);

Slawomir Pilarski, Beaverton, OR (US);

Assignee:

Synopsys, Inc., Mountain View, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 1/750 ;
U.S. Cl.
CPC ...
G06F 1/750 ;
Abstract

A method and apparatus for determining equivalence between two integrated circuit device designs. Functional blocks and compare points within a first design are compared with functional blocks and compare points in a second design to determine compare points that are matched. The integrated circuit designs are traversed net-wise and cut points are inserted at compare points that are matched and that are not determined to be constant. As each design is traversed, the design is flattened such that flat copies of both integrated circuit designs are obtained (that include the inserted cut points). The flat copies of the integrated circuit designs are then compared to determine equivalence.


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